Nova Ltd. operates at the measurement layer of semiconductor fabrication, providing dimensional, materials, and chemical metrology systems to the world's largest integrated circuit manufacturers. Since 1993, the company has built tooling specifically designed to make visible what happens at nanoscale - the physical dimensions of structures, material composition and properties, and chemical signatures that determine whether silicon actually works.
The technical stack combines advanced optics, physics, and chemistry with algorithms, machine learning, and big data analytics. Nova delivers both integrated systems embedded into fab processes and stand-alone instruments, covering the pipeline from R&D through high-volume manufacturing. The core problem: traditional metrology struggles to keep pace with semiconductor process advancement, and fabs need atomic-level accuracy to maintain yield and performance as feature sizes shrink.
The company serves customers across integrated circuit fabrication and process research globally, where metrology data flows back into process control loops and yield optimization. Precision in measurement directly translates to precision in manufacturing, making the tools foundational to how leading fabs debug process windows, characterize new materials, and ship products on time.